Newsroom

AOT CSTO Dr. Brian Hoover is on the program committee of the SPIE conference Reflection, Scattering, and Diffraction from Surfaces VII to be held in San Diego from 23-27 August 2020

AOT's new technique of crystallographic orientation imaging was introduced in the SPIE proceedings article Polarized Reflectivity for Quantitative Crystallography of alpha-Titanium.

Advanced Optical Technologies expands its facilities at Sandia Science & Technology Park announcing today that it has completed a 2,500 square foot addition and expanded its facility to 5,000 square feet.