Material Characterization Overview
Well-designed, exploitable material characterization is the key to success for many devices and sensors. Accurate material measurements can also propel physical models through verification and extension. AOT can characterize properties of your materials, from microstructural or electronic anisotropies to particle size to surface roughness and modulation depth, all measurable by non-destructive laser probes. Direct material measurements, often to the nanoscale, complement laser measurements and elucidate additional material properties. Atomic-force microscopy (AFM) direct surface measurements can provide three-dimensional nanoscale parameters critical to many electrical, optical, chemical, biological, and mechanical processes on surfaces, and AOT's extended-range AFM (exAFM) can extend your surface understanding over wider frequency bands.
