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AOT has developed and patented the key components that enable the first modern commercial applications of polarization imaging

Titanium Today's From the Wire highlights CrystalView applications for non-destructive quality control and preventative maintenance

AOT’s Crystallographic Polarization-Classification Imaging technology featured by Sandia National Laboratories

Advanced Optical Technologies (AOT) will be exhibiting the latest innovations in non-destructive surface and crystallographic characterization of titanium and other aerospace materials

AOT CSTO Dr. Brian Hoover is on the program committee of the SPIE conference Reflection, Scattering, and Diffraction from Surfaces VII to be held in San Diego from 23-27 August 2020

AOT's new technique of crystallographic orientation imaging was introduced in the SPIE proceedings article Polarized Reflectivity for Quantitative Crystallography of alpha-Titanium.