Newsroom
Newsroom

AOT Awarded International Patents for Its Platform Imaging Technology
AOT has developed and patented the key components that enable the first modern commercial applications of polarization imaging
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CrystalView Featured in Titanium Today
Titanium Today's From the Wire highlights CrystalView applications for non-destructive quality control and preventative maintenance
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Sandia Lab News Features AOT Imaging Technology
AOT’s Crystallographic Polarization-Classification Imaging technology featured by Sandia National Laboratories
Read MoreAOT is exhibiting at TMS Conference 2020
Advanced Optical Technologies (AOT) will be exhibiting the latest innovations in non-destructive surface and crystallographic characterization of titanium and other aerospace materials
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Reflection, Scattering, and Diffraction from Surfaces VII
AOT CSTO Dr. Brian Hoover is on the program committee of the SPIE conference Reflection, Scattering, and Diffraction from Surfaces VII to be held in San Diego from 23-27 August 2020
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Polarized Reflectivity for Quantitative Crystallography of alpha-Titanium
AOT's new technique of crystallographic orientation imaging was introduced in the SPIE proceedings article Polarized Reflectivity for Quantitative Crystallography of alpha-Titanium.
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