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Reflection, Scattering, and Diffraction from Surfaces VII 8 Feb, 2020

Reflection, Scattering, and Diffraction from Surfaces VII

Advanced Optical Technologies (AOT) CSTO Dr. Brian Hoover is on the program committee of the SPIE conference Reflection, Scattering, and Diffraction from Surfaces VII to be held in San Diego from 23-27 August 2020. Read More Polarized reflectivity for quantitative crystallography of alpha-Titanium 1 Feb, 2020

Polarized reflectivity for quantitative crystallography of alpha-Titanium

Advanced Optical Technologies’ new technique of crystallographic orientation imaging was introduced in the SPIE proceedings article Polarized reflectivity for quantitative crystallography of alpha-Titanium. Read More

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