Multi-dimensional material characterization promotes understanding of complex materials, devices, processes, and scenarios.  Treating materials as black boxes will limit the scalability, dimensionality, generality, and ultimately the value of any model, algorithm, or development process.  Accurate measurements of material properties provide insight into materials and the optical modalities used to measure them, and building upon modern measurement science and engineering ensures enduring value and elucidates new directions and capabilities in materials science, contributing to fundamental studies as well as the development of new materials, devices, and processes.

AOT measures polarization signatures with the world’s most accurate laboratory laser polarimeters and scatterometers and characterizes surfaces using extended-range AFM imaging.

Crystallographic NDT Material Characterization Optical Signature Databases Optical Calibration